rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: X-ray characterization of materials
  name:
    name part: Lifshin, Eric.
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    place:
      place term: Weinheim
    place:
      place term: New York
    publisher: Wiley-VCH
    date issued: ©1999
    date issued: 1999
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xvi, 261 pages) : illustrations
  abstract: Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composit.
  table of contents: X-ray diffraction / Robert L. Snyder -- Application of synchrotron X-radiation to problems in materials science / Andrea R. Gerson [and others] -- X-ray fluorescence analysis / Ronald Jenkins -- Small-angle scattering of x-rays and neutrons / Claudine E. Williams, Roland P. May, and André Guinier.
  note: Eric Lifshin (ed.).
  note: Includes bibliographical references and index.
  subject:
    topic: Materials
    topic: Analysis
  subject:
    topic: X-rays
    topic: Industrial applications
  subject:
    topic: X-ray spectroscopy
  subject:
    topic: Surfaces (Technology)
    topic: Analysis
  subject:
    topic: Spectrometry, X-Ray Emission
  classification: TA417.25 .X72 1999eb
  classification: 620.11272
  classification: UQ 5100
  classification: UQ 5600
  classification: VG 9900
  classification: CHE 242f
  classification: PHY 060f
  classification: WER 740f
  related item:
    title info:
      title: X-ray characterization of materials
    origin info:
      publisher: Weinheim ; New York : Wiley-VCH, ©1999
    identifier: (DLC) 00266150
  identifier: 9783527613748
  identifier: 3527613749
  identifier: 9783527613755
  identifier: 3527613757
  identifier: 9783527296576
  identifier: 3527296573
  identifier: 10.1002/9783527613748 Wiley InterScience
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: NhCcYBP
    record creation date: 080227
    record change date: 20260214203744.1
    record identifier: in00004689730
    language of cataloging:
      language term: eng