http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
1 online resource (xvi, 261 pages) : illustrations
Linking of materials properties with microstructures is a fundamental theme in materials science, for which a detailed knowledge of the modern characterization techniques is essential. Since modern materials such as high-temperature alloys, engineering thermoplastics and multilayer semiconductor films have many elemental constituents distributed in more than one phase, characterization is essential to the systematic development of such new materials and understanding how they behave in practical applications. X-ray techniques play a major role in providing information on the elemental composit.
X-ray diffraction / Robert L. Snyder -- Application of synchrotron X-radiation to problems in materials science / Andrea R. Gerson [and others] -- X-ray fluorescence analysis / Ronald Jenkins -- Small-angle scattering of x-rays and neutrons / Claudine E. Williams, Roland P. May, and André Guinier.
Includes bibliographical references and index.