Applications and metrology at nanometer scale. 2, Measurement systems, quantum engineering and RBDO method /

Bibliographic Details

Main Authors:	Dahoo, Pierre Richard (Author), Pougnet, Philippe (Author), El Hami, Abdelkhalak (Author)
Format:	eBook
Language:	English
Published:	London, UK : Hoboken, NJ : ISTE, Ltd. : Wiley, 2021.
Series:	Reliability of multiphysical systems set ; v. 10.
Subjects:	Metrology. Electronic books.
Online Access:	Connect to the full text of this electronic book