APA (7th ed.) Citation

Dahoo, P. R., Pougnet, P., & El Hami, A. (2021). Applications and metrology at nanometer scale. ISTE Ltd. ; Wiley.

Chicago Style (17th ed.) Citation

Dahoo, Pierre Richard, Philippe Pougnet, and Abdelkhalak El Hami. Applications and Metrology at Nanometer Scale. London : Hoboken: ISTE Ltd. ; Wiley, 2021.

MLA (9th ed.) Citation

Dahoo, Pierre Richard, et al. Applications and Metrology at Nanometer Scale. ISTE Ltd. ; Wiley, 2021.