rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Accelerated life testing of one-shot devices
    sub title: data collection and analysis
  name:
    name part: Balakrishnan, N.
    name part: 1956-
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Ling, Man Ho
    role:
      role term: author.
  name:
    name part: So, Hon Yiu
    role:
      role term: author.
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: nju
    date issued: 2021
    copyright date: 2021
    edition: First edition.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xiii, 223 pages) : illustrations
  abstract: "A one-shot device is a unit that performs its function only once and cannot be used for testing more than once. Examples include electric explosive devices, fire extinguishers, airbags in cars, and missiles. While testing one-shot devices, only the condition of the device at a specific inspection time can be recorded, and exact failure times cannot be obtained from the test. As a result, the lifetimes of devices are either left- or right-censored. Due to a lack of lifetime data collected in life-tests, estimating the reliability of one-shot devices in traditional approaches becomes challenging. This book primarily focuses on fundamental issues of statistical modeling based on one-shot device testing data collected from accelerated life-tests. This book also provides advanced statistical techniques. For instance, expectation-maximization algorithms and Bayesian approaches to deal with the estimation challenges, along with comprehensive data analysis of one-shot devices under accelerated life-tests. Readers may apply the techniques from this book to their own lifetime data with censoring. This book is ideal for graduate students, researchers, and engineers working on accelerated life testing data analysis"--
  table of contents: Front Matter -- One-Shot Device Testing Data -- Likelihood Inference -- Bayesian Inference -- Model Mis-Specification Analysis and Model Selection -- Robust Inference -- Semi-Parametric Models and Inference -- Optimal Design of Tests -- Design of Simple Step-Stress Accelerated Life-Tests -- Competing-Risks Models -- One-Shot Devices with Dependent Components -- Conclusions and Future Directions -- Derivation of Hi(a, b) -- Observed Information Matrix -- Non-Identifiable Parameters for SSALTs Under Weibull Distribution -- Optimal Design Under Weibull Distributions with Fixed w1 -- Conditional Expectations for Competing Risks Model Under Exponential Distribution -- Kendall's Tau for Frank Copula.
  note: Narayanaswamy Balakrishnan, McMaster University, Hamilton, Canada, Man Ho Ling, the Education University of Hong Kong, Tai Po, Hong Kong, Hon Yiu So, University of Waterloo, Waterloo, Canada.
  note: Includes bibliographical references and indexes.
  subject:
    topic: Accelerated life testing
  subject:
    topic: Failure analysis (Engineering)
  subject:
    topic: Equipment Failure Analysis
  classification: TA169.3 .B35 2021
  classification: 620/.00452
  related item:
    title info:
      title: Accelerated life testing of one-shot devices
    name:
      name part: Balakrishnan, N., 1956-
    origin info:
      publisher: Hoboken, NJ, USA : Wiley, 2021
      edition: First edition.
    identifier: (DLC) 2020035725
  identifier: 9781119664031
  identifier: 1119664039
  identifier: 9781119663942
  identifier: 1119663946
  identifier: 9781119664017
  identifier: 1119664012
  identifier: 9781119664000
  identifier: 2020035726
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: DLC
    record creation date: 200914
    record change date: 20260214200947.2
    record identifier: in00004687078
    language of cataloging:
      language term: eng