Materials and failures in MEMS and NEMS /

Bibliographic Details
Other Authors: Tiwari, Atul (Editor), Raj, Baldev, 1947-2018 (Editor)
Format: eBook
Language:English
Published: Hoboken, New Jersey : Salem, Massachusetts : John Wiley & Sons ; Scrivener Publishing, 2015.
Series:Materials degradation and failures series
Subjects:
Online Access:Connect to the full text of this electronic book

MARC

Tag First Indicator Second Indicator Subfields
LEADER 00000nam a2200000 i 4500
001 in00004683521
006 m o d
007 cr |||||||||||
008 150714s2015 nju ob 001 0 eng
005 20260214201201.8
010 |a  2015027730 
020 |a 9781119083870  |q (pdf) 
020 |a 1119083877  |q (pdf) 
020 |a 9781119083863  |q (epub) 
020 |a 1119083869  |q (epub) 
020 |a 9781119083887 
020 |a 1119083885 
020 |a 1119083605 
020 |a 9781119083603 
020 |z 9781119083603  |q (cloth ;  |q alk. paper) 
035 |a wil6007436 
035 |a (DLC)wil6007436 
037 |a 9781119083863  |b Wiley 
040 |a DLC  |b eng  |e rda  |e pn  |c DLC 
042 |a pcc 
050 0 0 |a TK7875  |b .M37 2015 
072 7 |a TEC  |x 009070  |2 bisacsh 
082 0 0 |a 621.381  |2 23 
245 0 0 |a Materials and failures in MEMS and NEMS /  |c edited by Atul Tiwari and Baldev Raj. 
264 1 |a Hoboken, New Jersey :  |b John Wiley & Sons ;  |a Salem, Massachusetts :  |b Scrivener Publishing,  |c 2015. 
300 |a 1 online resource 
336 |a text  |b txt  |2 rdacontent 
337 |a computer  |b c  |2 rdamedia 
338 |a online resource  |b cr  |2 rdacarrier 
490 0 |a Materials degradation and failures series 
504 |a Includes bibliographical references and index. 
588 0 |a Print version record and CIP data provided by publisher. 
505 0 |a Half Title page -- Title page -- Copyright page -- Preface -- Chapter 1: Carbon as a MEMS Material -- 1.1 Introduction -- 1.2 Structure and Properties of Glassy Carbon -- 1.3 Fabrication of C-MEMS Structures -- 1.4 Integration of C-MEMS Structures with Other Materials -- 1.5 Conclusion -- References -- Chapter 2: Intelligent Model-Based Fault Diagnosis of MEMS -- 2.1 Introduction -- 2.2 Model-Based Fault Diagnosis -- 2.3 Self-Tuning Estimation -- References -- Chapter 3: MEMS Heat Exchangers -- 3.1 Introduction 
505 8 |a 3.2 Fundamentals of Thermodynamics, Fluid Mechanics, and Heat Transfer3.3 MEMS Heat Sinks -- 3.4 MEMS Heat Pipes -- 3.5 Two-Fluid MEMS Heat Exchanger -- 3.6 Need for Microscale Internal Flow Passages -- Nomenclature -- Greek Alphabets -- Subscripts -- References -- Chapter 4: Application of Porous Silicon in MEMS and Sensors Technology -- 4.1 Introduction -- 4.2 Porous Silicon in Biosensors -- 4.3 Porous Silicon for Pressure Sensors -- 4.4 Conclusion -- References -- Chapter 5: MEMS/NEMS Switches with Silicon to Silicon (Si-to-Si) Contact Interface 
505 8 |a 5.1 Introduction5.2 Bi-Stable CMOS Front End Silicon Nanofin (SiNF) Switch for Non-volatile Memory Based On Van Der Waals Force -- 5.3 Vertically Actuated U-Shape Nanowire NEMS Switch -- 5.4 A Vacuum Encapsulated Si-to-Si MEMS Switch for Rugged Electronics -- 5.5 Summary -- References -- Chapter 6: On the Design, Fabrication, and Characterization of cMUT Devices -- 6.1 Introduction -- 6.2 cMUT Design and Finite Element Modeling Simulation -- 6.3 cMUT Fabrication and Characterization -- 6.4 Summary and Conclusions -- Acknowledgments -- References 
505 8 |a Chapter 7: Inverse Problems in the MEMS/NEMS Applications7.1 Introduction -- 7.2 Inverse Problems in the Micro/Nanomechanical Resonators -- 7.3 Inverse Problems in the MEMS Stiction Test -- Acknowledgment -- References -- Chapter 8: Ohmic RF-MEMS Control -- 8.1 Introduction -- 8.2 Charge Drive Control (Resistive Damping) -- 8.3 Hybrid Drive Control -- 8.4 Control Under High-Pressure Gas Damping -- 8.5 Comparison between Different Control Modes -- References -- Chapter 9: Dynamics of MEMS Devices -- 9.1 Introduction -- 9.2 Modeling and Simulation 
505 8 |a 9.3 Fabrication Methods9.4 Characterization -- 9.5 Device Failures -- Acknowledgments -- References -- Chapter 10: Buckling Behaviors and Interfacial Toughness of a Micron-Scale Composite Structure with a Metal Wire on a Flexible Substrate -- 10.1 Introduction -- 10.2 Buckling Behaviors of Constantan Wire under Electrical Loading -- 10.3 Interfacial Toughness between Constantan Wire and Polymer Substrate -- 10.4 Buckling Behaviors of Polymer Substrate Restricted by Constantan Wire -- 10.5 Conclusions -- Acknowledgments -- References 
650 0 |a Microelectromechanical systems  |x Design and construction. 
650 0 |a Nanoelectromechanical systems  |x Design and construction. 
700 1 |a Tiwari, Atul,  |e editor. 
700 1 |a Raj, Baldev,  |d 1947-2018,  |e editor. 
776 0 8 |i Print version:  |t Materials and failures in MEMS and NEMS.  |d Hoboken, New Jersey : John Wiley & Sons ; Salem, Massachusetts : Scrivener Publishing, 2015  |z 9781119083603  |w (DLC) 2015025146 
856 4 0 |u http://proxy.library.tamu.edu/login?url=https://onlinelibrary.wiley.com/book/10.1002/9781119083887  |z Connect to the full text of this electronic book  |t 0 
955 |a Wiley EBA record 
975 |p Wiley UBCM Full Collection 2026 
999 f f |s f91b368e-ecf1-49b3-931d-c0484b870250  |i 1d8cfedb-05d9-41df-91be-aeed28c97699  |t 0 
952 f f |a Texas A&M University  |b College Station  |c Electronic Resources  |s evans_pda  |d Available Online  |t 0  |e TK7875 .M37 2015  |h Library of Congress classification 
998 f f |a TK7875 .M37 2015  |t 0  |l Available Online