http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Total-reflection X-ray fluorescence analysis and related methods
1 online resource (xvi, 519 pages : : illustrations (some color.)
Explores the uses of TXRF in micro- and trace analysis, and in surface- and near-surface-layer analysis Pinpoints new applications of TRXF in different fields of biology, biomonitoring, material and life sciences, medicine, toxicology, forensics, art history, and archaeometry Updated and detailed sections on sample preparation taking into account nano- and picoliter techniques Offers helpful tips on performing analyses, including sample preparations, and spectra recording and interpretation Includes some 700 references for further study -- Provided by publisher.
Fundamentals of x-ray fluorescence -- Principles of total reflection XRF -- Instrumentation for TXRF and GI-XRF -- Performance of TXRF and GI-XRF analyses -- Different fields of applications -- Efficiency and evaluation -- Trends and future prospects.
Reinhold Klockenkamper, Alex von Bohlen, Leibniz-Institut für Analytische Wissenschaften, ISAS e.V., Dortmund and Berlin, Germany.
Includes bibliographical references and index.
Total-reflection X-ray fluorescence and related methods
Hoboken, New Jersey : John Wiley and Sons, Inc., 2014
Second edition, thoroughly updated and completely revised / Reinhold Klockenkamper, Alex von Bohlen, Leibniz-Institut für Analytische Wissenschaften, ISAS e.V., Dortmund, Germany.