rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Integrated circuit design for radiation environments
  name:
    name part: Gaul, Stephen J.
    name part: 1957-
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Vonno, Nocolaas van
    role:
      role term: author.
  name:
    name part: Voldman, Steven H.
    role:
      role term: author.
  name:
    name part: Morris, Wesley H.
    role:
      role term: author.
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: nju
    date issued: 2020
    copyright date: 2020
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource
  abstract: "The authors structure the book so that readers can understand the problem of radiation effects first, then understand the skills of layout design and ciruit design after. Chapter One and Chapter Two introduce semiconductors and radiation environments including space, atmospheric and terrestrial environments. Chapter Three details radiation and semiconductor physics. It discusses elementary particle physics so that readers can see how the areas of semiconductors and fundamental interact. Radioactive decay, field equations and transistors are presented in this section too. Damage mechanisms in semiconductors is covered in Chapter Four, including coverage of radiation damage in silicon devices. This leads on logically to single event effects in the next chapter, covering single event upset (SEU), single event gate rupture (SEGR), single event transient (SET), single event latchup (SEL), and radiation techniques. Chapter Six presents radiation-hard semiconductor process and layout techniques, with information on off-the-shelf process technology, and device specific hardening methods. Helpful SEU semiconductor process solutions for SEU are covered in detail in Chapter Seven. Solutions covered include: wells, p-wells, isolation, triple-well, sub-collectors, deep trench and more. Chapter Eight goes into detail on the area of SEU circuit solutions, while Chapter Nine details latchup semiconductor process solutions. Chapter Ten presents Latchup circuit solutions and concluds with a look at emerging effects in future technologies"--
  note: Stephen J. Gaul, Nicolaas van Vonno, Steven H. Voldman, Wesley H. Morris.
  note: Includes bibliographical references and index.
  subject:
    topic: Integrated circuits
    topic: Design and construction
  subject:
    topic: Semiconductors
    topic: Effect of radiation on
  classification: TK7874 .G379 2020
  classification: 621.3815
  related item:
    title info:
      title: Integrated circuit design for radiation environments
    name:
      name part: Gaul, Stephen J., 1957-
    origin info:
      publisher: Hoboken : Wiley, 2019.
    identifier: (DLC) 2019025698
  identifier: 9781118701850
  identifier: 1118701852
  identifier: 9781118701867
  identifier: 1118701860
  identifier: 9781118701874
  identifier: 1118701879
  identifier: 9781119966340
  identifier: 2019025699
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: DLC
    record creation date: 190618
    record change date: 20260214212351.6
    record identifier: in00004681747
    language of cataloging:
      language term: eng