rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Introduction to X-ray powder diffractometry
  name:
    name part: Jenkins, Ron
    name part: 1932-
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Snyder, R. L. (Robert L.)
    name part: 1941-
    role:
      role term: author.
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: nyu
    place:
      place term: New York
    publisher: Wiley
    date issued: ©1996
    date issued: 1996
    issuance: monographic
  language:
    language term: eng
  physical description:
    reformatting quality: preservation
    reformatting quality: access
    form: remote
    extent: 1 online resource (xxiii, 403 pages) : illustrations
  abstract: When bombarded with X-rays, solid materials produce distinct scattering patterns similar to fingerprints. X-ray powder diffraction is a technique used to fingerprint solid samples, which are then identified and cataloged for future use-much the way the FBI keeps fingerprints on file. The current database of some 70,000 material prints has been put to a broad range of uses, from the analysis of moon rocks to testing drugs for purity.Introduction to X-ray Powder Diffractometry fully updates the achievements in the field over the past fifteen years and provides a much-needed explanation o.
  table of contents: Introduction to X-ray Powder Diffractometry; CONTENTS; PREFACE; CUMULATIVE LISTING OF VOLUMES IN SERIES; CHAPTER 1. CHARACTERISTICS OF X-RADIATION; 1.1. Early Development of X-ray Diffraction; 1.2. Origin of X-radiation; 1.3. Continuous Radiation; 1.4. Characteristic Radiation; 1.4.1. The Photoelectric Effect; 1.4.2. The Auger Effect; 1.4.3. Fluorescent Yield; 1.4.4. Selection Rules; 1.4.5. Nondiagram Lines; 1.4.6. Practical Form of the Copper K Spectrum; 1.5. Scattering of X-rays; 1.5.1. Coherent Scatter; 1.5.2. Compton Scatter; 1.6. Absorption of X-rays; 1.7. Safety Considerations
  table of contents: 2.4. Space Group Theory2.5. Crystallographic Planes and Miller Indices; References; CHAPTER 3. DIFFRACTION THEORY; 3.1. Diffraction of X-rays; 3.2. The Reciprocal Lattice; 3.3. The Ewald Sphere of Reflection; 3.4. Origin of the Diffraction Pattern; 3.4.1. Single Crystal Diffraction; 3.4.2. The Powder Diffraction Pattern; 3.5. The Location of Diffraction Peaks; 3.6. Intensity of Diffraction Peaks; 3.6.1. Electron Scattering; 3.6.2. The Atomic Scattering Factor; 3.6.3. Anomalous Scattering; 3.6.4. Thermal Motion; 3.6.5. Scattering of X-rays by a Crystal: The Structure Factor
  table of contents: 3.7. The Calculated Diffraction Pattern3.7.1. Factors Affecting the Relative Intensity of Bragg Reflections; 3.7.2. The Intensity Equation; 3.8. Calculation of the Powder Diffraction Pattern of KCl; 3.9. Anisotropic Distortions of the Diffraction Pattern; 3.9.1. Preferred Orientation; 3.9.2. Crystallite Size; 3.9.3. Residual Stress and Strain; References; CHAPTER 4. SOURCES FOR THE GENERATION OF X-RADIATION; 4.1. Components of the X-ray Source; 4.2. The Line-Voltage Supply; 4.3. The High-Voltage Generator; 4.3.1. Selection of Operating Conditions; 4.3.2. Source Stability
  table of contents: 4.4. The Sealed X-ray Tube4.4.1. Typical X-ray Tube Configuration; 4.4.2. Specific Loading; 4.4.3. Care of the X-ray Tube; 4.5. Effective Line Width; 4.6. Spectral Contamination; 4.6.1. X-ray Tube Life; 4.7. The Rotating Anode X-ray Tube; References; CHAPTER 5. DETECTORS AND DETECTION ELECTRONICS; 5.1. X-ray Detectors; 5.2. Desired Properties of an X-ray Detector; 5.2.1. Quantum-Counting Efficiency; 5.2.2. Linearity; 5.2.3. Energy Proportionality; 5.2.4. Resolution; 5.3. Types of Detector; 5.3.1. The Gas Proportional Counter; 5.3.2. Position-Sensitive Detectors
  note: Ron Jenkins, Robert L. Snyder.
  note: Electronic reproduction. [Place of publication not identified] : HathiTrust Digital Library, 2010. MiAaHDL
  note: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
  note: digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL
  note: Includes bibliographical references and index.
  note: English.
  subject:
    topic: X-rays
    topic: Diffraction
    topic: Technique
  subject:
    topic: X-ray diffractometer
  subject:
    topic: Powders
    topic: Optical properties
    topic: Measurement
  classification: QC482.D5 J46 1996
  classification: QD75 .C5 v.138
  classification: 548/.83
  classification: 51.10
  related item:
    title info:
      title: Introduction to X-ray powder diffractometry
    name:
      name part: Jenkins, Ron, 1932-
    origin info:
      publisher: New York : Wiley, ©1996
    identifier: (DLC) 96012039
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  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: NhCcYBP
    record creation date: 101102
    record change date: 20260214202557.4
    record identifier: in00004680268
    language of cataloging:
      language term: eng