High-temperature superconductor materials, devices, and applications : proceedings of the 106th Annual Meeting of the American Ceramic Society : Indianapolis, Indiana, USA (2004) /

This proceedings investigates the relationship between features at the atomic level including oxygen vacancies, stacking faults and site order/disorder, grain boundaries, film-substrate interactions, buffer-superconductor interactions, thermodynamic, transport, and other macroscopic properties. This...

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Bibliographic Details
Corporate Authors: American Ceramic Society. Meeting, High-Temperature Superconductor Materials, Devices and Applications
Other Authors: Paranthaman, M. P. (Mariappan Parans)
Format: Conference Proceeding eBook
Language:English
Language Notes:English.
Published: Westerville, Ohio : American Ceramic Society, ©2005.
Series:Ceramic transactions ; v. 160.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Summary:This proceedings investigates the relationship between features at the atomic level including oxygen vacancies, stacking faults and site order/disorder, grain boundaries, film-substrate interactions, buffer-superconductor interactions, thermodynamic, transport, and other macroscopic properties. This proceedings will also cover fundamental material properties studies, new growth methods, device and materials integration research, and developments in designing and growing new materials, all involving epitaxial superconducting thin films.
Item Description:"This volume contains proceedings of the papers presented at the High-Temperature Superconductor Materials, Devices and Applications Symposium [held] during the 106th Annual Meeting of the American Ceramic Society (ACerS), April 18-21, 2004 in Indianapolis, Indiana."--Page vii
Physical Description:1 online resource (viii, 90 pages) : illustrations
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references and indexes.
ISBN:9781118407165
1118407164
9781118407172
1118407172
1280673060
9781280673061
9786613649997
6613649996