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Testing for EMC compliance : approaches and techniques /

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The Keep It Simple (KISS) philosophy is the primary focus of this book. It is written in very simple language with minimal math, as a compilation of helpful EMI troubleshooting hints. Its light-hearted tone is at odds with the extreme seriousness of most engineering reference works that become borin...

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Bibliographic Details
Main Author: Montrose, Mark I.
Other Authors: Nakauchi, Edward M.
Format: eBook
Language:English
Published: Hoboken, NJ : John Wiley, 2004.
Subjects:
Electromagnetic compatibility.
Electromagnetic interference.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Cover
  • CONTENTS
  • Preface
  • Acknowledgments
  • 1 Introduction
  • 1.1 The Need to Comply
  • 1.2 Definitions
  • 1.3 Nature of Interference
  • 1.4 Overview on Product Testing
  • 1.4.1 Test Environment
  • 1.4.2 Self-Compatibility
  • 1.4.3 Validation of Measured Data
  • 1.4.4 Problems during Emissions Testing
  • 1.5 Time-Domain versus Frequency-Domain Analysis
  • 1.6 EMC Testing Methodologies
  • 1.6.1 Development Testing and Diagnostics
  • 1.6.2 Compliance and Precompliance Testing
  • References
  • 2 Electric, Magnetic, and Static Fields
  • 2.1 Relationship between Electric and Magnetic Fields
  • 2.2 Methods of Noise Coupling
  • 2.2.1 Common-Impedance Coupling
  • 2.2.2 Electromagnetic Field Coupling
  • 2.2.3 Conductive Coupling
  • 2.2.4 Radiated Coupling ... Magnetic Field
  • 2.2.5 Radiated Coupling ... Electric Field
  • 2.2.6 Radiated and Conducted Coupling Combined
  • 2.3 Common-Mode Currents versus Differential-Mode Currents
  • 2.3.1 Differential-Mode Currents
  • 2.3.2 Common-Mode Currents
  • 2.3.3 Example on Difference between Differential- and Common-Mode Currents
  • 2.3.4 Radiation due to Differential-Mode Currents
  • 2.3.5 Common-Mode Radiation
  • 2.3.6 Conversion between Differential- and Common-Mode Energy
  • 2.4 Static Fields
  • 2.4.1 Electrostatic Discharge Waveforms
  • 2.4.2 Triboelectric Series
  • 2.4.3 Failure Modes From a Static Event
  • References
  • 3 Instrumentation
  • 3.1 Time-Domain Analyzer (Oscilloscope)
  • 3.1.1 Oscilloscope Probes
  • 3.2 Frequency-Domain Analyzers
  • 3.2.1 Spectrum Analyzers
  • 3.2.2 Receivers
  • 3.3 Precompliance versus Compliance Analyzers
  • 3.4 Correlation Analyzer
  • 3.4.1 Characteristics of Cancellation System
  • 3.4.2 Coherence Factor
  • References
  • 4 Test Facilities
  • 4.1 Open-Area Test Sites
  • 4.1.1 Requirements for an OATS
  • 4.1.2 Test ConfigurationSystem, Power, and Cable Interconnects
  • 4.1.3 Operating Conditions
  • 4.1.4 Measurement Precautions
  • 4.1.5 Alternate Test Sites
  • 4.2 Chambers
  • 4.2.1 Anechoic Chamber
  • 4.2.2 Screen/Shield Rooms
  • 4.2.3 Reverberation Chamber
  • 4.3 Cells
  • 4.3.1 TEM Cell
  • 4.3.2 GTEM Cell
  • References
  • 5 Probes, Antennas, and Support Equipment
  • 5.1 Need for Probes, Antennas, and Support Equipment
  • 5.2 Voltage Probes
  • 5.3 Current Probes
  • 5.3.1 Specifying a Current Probe
  • 5.3.2 Limitations When Using Current Probes
  • 5.4 LISN/AMN (AC Mains)
  • 5.5 CDNs (Data and Signal Lines)
  • 5.6 Absorbing Clamp
  • 5.6.1 Test Setup and Measurement Procedure
  • 5.7 Bulk Current InjectionProbe and Insertion Clamp
  • 5.7.1 Choosing a BCI Probe
  • 5.8 Basic Probe TypesNear Field and Closed Field
  • 5.9 Sniffer Probes
  • 5.9.1 Near-Field Probes
  • 5.9.2 Commercial Probes
  • 5.10 Differential-Mode Probes
  • 5.11 Home-Made Probes
  • 5.12 Alternate Troubleshooting Devices
  • 5.13 Far-Field Antennas
  • 5.13.1 Common Antennas Used for EMC Testing
  • References
  • 6 Conducted Testing
  • 6.1 Overview of Conducted Currents
  • 6.1.1 Common- and Differential-Mode Currents on Wires.