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Machine Learning Support for Fault Diagnosis of System-on-Chip /

This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer retu...

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Bibliographic Details
Corporate Author: SpringerLink (Online service)
Other Authors: Girard, Patrick (Editor), Blanton, Shawn (Editor), Wang, Li-C (Editor)
Format: eBook
Language:English
Published: Cham : Springer International Publishing : Imprint: Springer, 2023.
Edition:1st ed. 2023.
Subjects:
Electronic circuits.
Electronic circuit design.
Microprocessors.
Computer architecture.
Electronic Circuits and Systems.
Electronics Design and Verification.
Processor Architectures.
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Introduction
  • Prerequisites on Fault Diagnosis
  • Conventional Methods for Fault Diagnosis
  • Machine Learning and Its Applications in Test
  • Machine Learning Support for Logic Diagnosis
  • Machine Learning Support for Cell-Aware Diagnosis
  • Machine Learning Support for Volume Diagnosis
  • Machine Learning Support for Diagnosis of Analog Circuits
  • Machine Learning Support for Board-level Functional Fault Diagnosis
  • Machine Learning Support for Wafer-level Failure Cluster Identification
  • Conclusion.