Machine Learning Support for Fault Diagnosis of System-on-Chip /
This book provides a state-of-the-art guide to Machine Learning (ML)-based techniques that have been shown to be highly efficient for diagnosis of failures in electronic circuits and systems. The methods discussed can be used for volume diagnosis after manufacturing or for diagnosis of customer retu...
| Corporate Author: | SpringerLink (Online service) |
|---|---|
| Other Authors: | Girard, Patrick (Editor), Blanton, Shawn (Editor), Wang, Li-C (Editor) |
| Format: | eBook |
| Language: | English |
| Published: |
Cham :
Springer International Publishing : Imprint: Springer,
2023.
|
| Edition: | 1st ed. 2023. |
| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
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