Failure Analysis : High Technology Devices /

Bibliographic Details
Main Author: Sullivan, Daniel J. D.
Corporate Author: Walter de Gruyter & Co
Other Authors: Carleton, Eric J.
Format: eBook
Language:English
Published: Boston : Walter de Gruyter, [2022]
Series:De Gruyter STEM.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Physical Description:1 online resource ( 130 p..) :
ISBN:9781501524790
1501524798