rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Fault diagnosis for robust inverter power drives
  name:
    name part: Ginart, Antonio
    role:
      role term: editor.
  name:
    name part: Knovel (Firm)
  name:
    name part: Institution of Engineering and Technology
    role:
      role term: publisher.
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 2018
    copyright date: 2019
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xi, 304 pages) : illustrations
  abstract: This book deals with the concept that the specification of a power component needs a life expectancy associated with other important factors, to allow the appropriate component selection when designing robust and reliable systems. An analysis of the fundamental physics of aging in power drive components and the markers that diagnose the process towards failure is presented to illustrate to the reader state-of-the-art approaches to increase reliability. Amongst the many factors playing an important role in designing a robust power drive, the main factor deals with how long the power drive will last at the conditions in which it will be operating. In particular, the book looks at invertor power drive reliability and diagnosis; power semiconductors, SiC, GaN, MOSFETs and IGBTs; DC-link capacitors; embedded fault diagnosis and prognosis; fault tolerance strategies for power convertors; motor diagnostics and protection using invertor capabilities; battery storage; prognostics with a particular application to a battery.
  table of contents: Intro; Contents; Preface; 1. Fundamentals for reliability and early diagnosis for inverter power drives / José Manuel Aller, Antonio Ginart, and George Vachtsevanos; 1.1 Introduction; 1.1.1 Manufacture defects (early failure); 1.1.2 Random failure; 1.1.3 Wear-out failure; 1.2 Statistical life estimation and failure rate: the bathtub curve; 1.2.1 Reliability R(t) and unreliability F(t) functions; 1.2.2 Probability density function and medium time before failure; 1.2.3 Failure rate function; 1.2.4 Exponential distribution; 1.2.5 Weibull distribution
  table of contents: 1.3 Degradation, failure mechanisms, and life model estimation1.3.1 Solid-stare materials; 1.3.2 Failure modes and physics-based life model calculation; 1.4 Inverters failure and power drives; 1.5 Circuit with ideal switches: power switches fundamentals; 1.6 PWM, the enabler of power electronics; 1.7 Switching under RL circuit load; 1.8 RLC circuit; 1.8.1 Series RLC model; 1.8.2 Shunt RLC model; 1.9 PWM in inverters; 1.10 Inverter basic operation; 1.11 Three-phase and multilevel inverters; 1.12 Operation principle of multilevel inverters; 1.13 Dominant topology; 1.14 Resonant converters
  table of contents: 1.15 Real switches: power losses in hard switching1.15.1 Conduction losses; 1.15.2 Switching losses; 1.16 Thermal consideration; 1.16.1 State modeling of the thermal system; 1.16.2 Thermal runaway; References; 2. Early diagnosis in power semiconductors: MOSFET, IGBT, emerging materials (SiC and GaNs) / Antonio Ginart, José M. Aller, and George J. Vachtsevanos; 2.1 Introduction; 2.1.1 Power device stress factors; 2.1.2 Silicon power MOSFET structure and parasitics; 2.1.3 SiC power MOSFET structure and parasitics; 2.1.4 GaNs structure and parasitics; 2.1.5 IGBT structure and latch-up
  table of contents: 2.2 Switching process in semiconductors2.2.1 Field distortion acceleration model; 2.3 Relevant indicators in power semiconductors; 2.3.1 Voltage Vth and capacitance shift; 2.3.2 Ringing characterization and turn-on delay; 2.3.3 Detachment and wire bond fatigue; 2.3.4 Junction temperature of power semiconductor; References; 3. Early diagnosis in DC-link capacitors: electrolytic and films / Chetan Kulkarni, José Celaya, and Kai Goebel; 3.1 Introduction; 3.1.1 Research challenges; 3.1.2 Organization; 3.2 Modeling for prognostics; 3.3 Research methodology
  table of contents: 3.4 Degradation in electrolytic capacitors3.4.1 Degradation mechanisms; 3.4.2 Capacitor degradation models; 3.4.3 Physics-based models for C and ESR; 3.4.4 Time-dependent degradation models; 3.5 Model-based prognostics framework; 3.5.1 Kalman filter for state estimation; 3.5.2 Future state forecasting; 3.5.3 Noise models; 3.5.4 Prognostics problem formulation; 3.5.5 Physics-based modeling framework using unscented Kalman filter; 3.6 Accelerated aging experiments; 3.6.1 Experimental setup; 3.6.2 Electrical overstress; 3.6.3 EOS experiment
  note: edited by Antonio Ginart.
  note: Includes bibliographical references and index.
  subject:
    topic: Electric inverters
  subject:
    topic: Electric fault location
  subject:
    topic: Fault tolerance (Engineering)
  subject:
    topic: Onduleurs (Électricité)
  subject:
    topic: Défauts électriques
    topic: Localisation
  subject:
    topic: Tolérance aux fautes (Ingénierie)
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Mechanical
  subject:
    topic: Electric fault location
  subject:
    topic: Electric inverters
  subject:
    topic: Fault tolerance (Engineering)
  subject:
    topic: cells (electric)
  subject:
    topic: electric drives
  subject:
    topic: electric motors
  subject:
    topic: fault diagnosis
  subject:
    topic: fault tolerance
  subject:
    topic: invertors
  subject:
    topic: power capacitors
  subject:
    topic: power semiconductor devices
  subject:
    topic: semiconductor device reliability
  classification: TK2699 .F38 2018eb
  classification: 621.3815322
  related item:
    title info:
      title: Fault diagnosis for robust inverter power drives
    origin info:
      publisher: London : Institution of Engineering and Technology, 2018
    identifier: (OCoLC)1079438064
  related item:
    title info:
      title: IET energy engineering series ; 120
  identifier: 1785614118
  identifier: 9781785614118
  identifier: 9781523121182
  identifier: 1523121181
  identifier: 9781785614101
  identifier: 178561410X
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: UIU
    record creation date: 190110
    record change date: 20230110224354.3
    record identifier: in00004639437
    language of cataloging:
      language term: eng