Mathematical models for systems reliability /

Bibliographic Details
Main Author: Epstein, Benjamin, 1918 (Author)
Corporate Author: Taylor & Francis
Other Authors: Weissman, Ishay, 1940-
Format: eBook
Language:English
Published: Boca Raton : Taylor and Francis, 2008.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Item Description:A CRC title.
Physical Description:1 online resource (272 pages)
ISBN:9780429126024