rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Cross-Layer Reliability of Computing Systems
  name:
    name part: Di Natale, Giorgio
    role:
      role term: ed.
  name:
    name part: Gizopoulos, Dimitris
    role:
      role term: ed.
  name:
    name part: Di Carlo, Stefano
    role:
      role term: ed.
  name:
    name part: Bosio, Alberto
    role:
      role term: ed.
  name:
    name part: Canal, Ramon
    role:
      role term: ed.
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    place:
      place term: Stevenage
    publisher: IET
    date issued: 2020
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (329 pages)
  abstract: The book deals with the following subjects: cross-layer reliability of computing systems; design techniques to improve the resilience of computing systems; technological layer; logic layer; architectural layer; software layer; cross-layer resilience; physical stress; soft error modeling and simulation; microarchitecture-level reliability assessment of multi-core processors; fault injection at the instruction set architecture (ISA) level; analytical modeling; and stochastic methods.
  target audience: specialized
  note: Giorgio Di Natale; Dimitris Gizopoulos; Stefano Di Carlo; Alberto Bosio; Ramon Canal [Eds].
  subject:
    topic: Computer architecture
  subject:
    topic: Stochastic processes
  subject:
    topic: computer architecture
  subject:
    topic: fault tolerant computing
  subject:
    topic: instruction sets
  subject:
    topic: multiprocessing systems
  subject:
    topic: stochastic processes
  subject:
    topic: logic layer
  subject:
    topic: technological layer
  subject:
    topic: cross-layer resilience
  subject:
    topic: software layer
  subject:
    topic: architectural layer
  subject:
    topic: soft error simulation
  subject:
    topic: soft error modeling
  subject:
    topic: physical stress
  subject:
    topic: ISA level
  subject:
    topic: instruction set architecture level
  subject:
    topic: fault injection
  subject:
    topic: multicore processors
  subject:
    topic: microarchitecture-level reliability assessment
  subject:
    topic: analytical modeling
  subject:
    topic: cross-layer resiliency
  subject:
    topic: stochastic methods
  related item:
    title info:
      title: Materials, Circuits & Devices
  identifier: 9781785617980
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: UkSgIET
    record creation date: 201127
    record change date: 20220506185138.9
    record identifier: in00004566874
    language of cataloging:
      language term: eng