Fundamentals of bias temperature instability in MOS transistors : characterization methods, process and materials impact, DC and AC modeling /

Bibliographic Details

Other Authors:	Mahapatra, Souvik (Editor)
Format:	Book
Language:	English
Published:	New Delhi : Springer, [2016]
Series:	Springer series in advanced microelectronics ; v. 52.
Subjects:	Metal oxide semiconductor field-effect transistors.