DNA damage recognition /

Bibliographic Details
Other Authors: Siede, Wolfram, Kow, Yoke Wah, Doetsch, Paul W.
Format: Book
Language:English
Published: New York : Taylor & Francis, 2006.
Subjects:
Description
Physical Description:xxii, 845 pages, 24 pages of plates : illustrations (some color) ; 27 cm.
Bibliography:Includes bibliographical references and index.
ISBN:0824759613 (alk. paper)