Applied logistic regression /

Bibliographic Details
Main Author: Hosmer, David W.
Other Authors: Lemeshow, Stanley
Format: Book
Language:English
Published: New York : Wiley, [1989]
Series:Wiley series in probability and mathematical statistics. Applied probability and statistics.
Subjects:
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by Hosmer, David W.
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by Hosmer, David W.
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by Hosmer, David W.
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by Hosmer, David W.
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by Hosmer, David W.
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by Hosmer, David W.
Published 1989
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