SpringerLink (Online service), Nicosia, G., Ojha, V., La Malfa, E., Jansen, G., Sciacca, V., . . . Umeton, R. (2020). Machine Learning, Optimization, and Data Science: 6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020, Revised Selected Papers, Part II (1st ed. 2020.). Springer International Publishing : Imprint: Springer. https://doi.org/10.1007/978-3-030-64580-9
Chicago Style (17th ed.) CitationSpringerLink (Online service), Giuseppe Nicosia, Varun Ojha, Emanuele La Malfa, Giorgio Jansen, Vincenzo Sciacca, Panos Pardalos, Giovanni Giuffrida, and Renato Umeton. Machine Learning, Optimization, and Data Science: 6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020, Revised Selected Papers, Part II. 1st ed. 2020. Cham: Springer International Publishing : Imprint: Springer, 2020. https://doi.org/10.1007/978-3-030-64580-9.
MLA (9th ed.) CitationSpringerLink (Online service), et al. Machine Learning, Optimization, and Data Science: 6th International Conference, LOD 2020, Siena, Italy, July 19-23, 2020, Revised Selected Papers, Part II. 1st ed. 2020. Springer International Publishing : Imprint: Springer, 2020. https://doi.org/10.1007/978-3-030-64580-9.