rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Springer Handbook of Microscopy
  name:
    name part: Hawkes, Peter W.
    role:
      role term: editor.
    role:
      role term: edt
    role:
      role term: http://id.loc.gov/vocabulary/relators/edt
  name:
    name part: Spence, John C.H.
    role:
      role term: editor.
    role:
      role term: edt
    role:
      role term: http://id.loc.gov/vocabulary/relators/edt
  name:
    name part: SpringerLink (Online service)
  type of resource: text
  genre: Electronic books.
  origin info:
    place:
      place term: sz
    date issued: 2019
    edition: 1st ed. 2019.
    issuance: monographic
  language:
    language term: eng
  physical description:
    reformatting quality: access
    form: remote
    extent: 1 online resource (XXXII, 1543 pages 1140 illustrations in color.)
  abstract: This book features reviews by leading experts on the methods and applications of modern forms of microscopy. The recent awards of Nobel Prizes awarded for super-resolution optical microscopy and cryo-electron microscopy have demonstrated the rich scientific opportunities for research in novel microscopies. Earlier Nobel Prizes for electron microscopy (the instrument itself and applications to biology), scanning probe microscopy and holography are a reminder of the central role of microscopy in modern science, from the study of nanostructures in materials science, physics and chemistry to structural biology. Separate chapters are devoted to confocal, fluorescent and related novel optical microscopies, coherent diffractive imaging, scanning probe microscopy, transmission electron microscopy in all its modes from aberration corrected and analytical to in-situ and time-resolved, low energy electron microscopy, photoelectron microscopy, cryo-electron microscopy in biology, and also ion microscopy. In addition to serving as an essential reference for researchers and teachers in the fields such as materials science, condensed matter physics, solid-state chemistry, structural biology and the molecular sciences generally, the Springer Handbook of Microscopy is a unified, coherent and pedagogically attractive text for advanced students who need an authoritative yet accessible guide to the science and practice of microscopy.
  table of contents: Part A: Electron and Ion Microscopy -- Kirkland and others: Atomic Resolution Transmission Electron Microscopy -- Nellist: Scanning Transmission Electron Microscopy -- Ross and Minor: In situ Transmission Electron Microscopy -- Plitzko and Baumeister: Crytoelectron TEM -- Erdmann et al: Scanning Electron Microscopy -- Thiel: Variable Pressure Scanning Electron Microscopy -- Botton, Pradhudev: Analytical Electron Microscopy -- Campbell et al: High-Speed Electron Microscopy -- Bauer: LEEM, SPLEEM and SPELEEM -- Feng and Scholl: Photoemission Electron Microscopy -- Tromp: Spectroscopy with the Low Energy Electron Microscope -- Van Aert: Model-Based Electron Microscopy -- Hawkes and Krivanek: Aberration Correctors, Monochromators, Spectrometer -- Hlawacek: Ion Microscopy.-Kelly: Atom-Probe Tomography -- Part B: Holography, Ptychography and Diffraction -- Dunin-Borkowski and others: Electron Holography.-Rodenburg and Maiden: Ptychography -- Zuo: Electron Nanodiffraction -- Musumeci and Li: High-Energy Time-Resolved Electron Diffraction -- Spence: Diffractive Imaging of Single Particles -- Part C: Photon-based Microscopy -- Diaspro et al: Fluorescence Microscopy -- Sahl and others: Far-Field Fluorescence Microscopy -- Jacobson et al: Zone-Plate X-Ray Microscopy -- Lin et al: Microcomputed Tomography -- Part D: Applied Microscopy -- Huey et al: Scanning Probe Microscopy in Materials Science -- Leary and Midgeley: Electron Tomography in Materials Science -- Sutter: Scanning Tunneling Microscopy in Surface Science -- Hamidian et al: Visualizing electronic quantum matter -- Ma et al (Terasaki): Microscopy of Nanoporous Crystals -- Wen: Biomedical X-Ray Phase-Contrast Imaging and Tomography -- Amrein and Stamov: Atomic Force Microscopy in the Life Sciences -- Jones: Microscopy in Forensic Sciences.
  note: edited by Peter W. Hawkes, John C.H. Spence.
  subject:
    topic: Materials science
  subject:
    topic: Spectroscopy
  subject:
    topic: Microscopy
  subject:
    topic: Characterization and Evaluation of Materials
  subject:
    topic: Spectroscopy and Microscopy
  subject:
    topic: Biological Microscopy
  subject:
    topic: Spectroscopy/Spectrometry
  classification: TA404.6
  classification: 620.11
  related item:
    title info:
      title: Springer Nature eBook
  related item:
    title info:
      title: Springer Handbooks
  identifier: 9783030000691
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record creation date: 191102
    record change date: 20230330185343.7
    record identifier: in00004413792