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Far-infrared dielectric functions : silicon nitride (SiNx), silicon oxide (SiOx), and high-purity silicon (Si) /

Bibliographic Details
Main Authors: Cataldo, Giuseppe (Author), Wollack, Edward J. (Author)
Format: Government Document eBook
Language:English
Published: Greenbelt, MD : National Aeronautics and Space Administration, Goddard Space Flight Center, September 2020.
Series:NASA technical memorandum ; 20205007162.
Subjects:
Numerical analysis.
Dielectric properties.
Dielectrics.
Online Access:https://purl.fdlp.gov/GPO/gpo146378
Description
Item Description:"September 2020."
Physical Description:1 online resource (26 pages) : color illustration.
Bibliography:Includes bibliographical references (page 2).