Cataldo, G., & Wollack, E. J. (2020). Far-infrared dielectric functions: Silicon nitride (SiNx), silicon oxide (SiOx), and high-purity silicon (Si). National Aeronautics and Space Administration, Goddard Space Flight Center.
Chicago Style (17th ed.) CitationCataldo, Giuseppe, and Edward J. Wollack. Far-infrared Dielectric Functions: Silicon Nitride (SiNx), Silicon Oxide (SiOx), and High-purity Silicon (Si). Greenbelt, MD: National Aeronautics and Space Administration, Goddard Space Flight Center, 2020.
MLA (9th ed.) CitationCataldo, Giuseppe, and Edward J. Wollack. Far-infrared Dielectric Functions: Silicon Nitride (SiNx), Silicon Oxide (SiOx), and High-purity Silicon (Si). National Aeronautics and Space Administration, Goddard Space Flight Center, 2020.
Warning: These citations may not always be 100% accurate.