Cover Image

Microwave photoelasticity : a resonant wavelength approach applied to PEEK polymer /

Bibliographic Details
Main Author: Schemmel, Peter J. (Author)
Format: Government Document eBook
Language:English
Published: Cleveland, Ohio : National Aeronautics and Space Administration, Glenn Research Center, March 2020.
Series:NASA technical memorandum ; 2020-220499.
Subjects:
Polymers.
PEEK.
Nondestructive tests.
Photoelasticity.
Materials tests.
Online Access:https://purl.fdlp.gov/GPO/gpo135850
Description
Item Description:"March 2020."
Physical Description:1 online resource (12 pages) : color illustrations.
Bibliography:Includes bibliographical references (pages 11-12).