Aberration-corrected imaging in transmission electron microscopy : an introduction /

Bibliographic Details
Main Author: Erni, Rolf (Author)
Corporate Author: World Scientific (Firm)
Format: eBook
Language:English
Published: London : Imperial College Press, [2015]
Edition:Second edition.
Subjects:
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • High-resolution transmission electron microscopy
  • Scanning transmission electron microscopy
  • Limits of conventional atomic-resolution electron microscopy
  • Basic principles of electron optics
  • Gaussian dioptrics
  • Aberrations
  • Aberration correctors
  • Aberration-corrected imaging.