CompTIA Network All-in-One Exam Guide, Fourth Edition, 4th Edition /

All-in-One is All You Need Get complete coverage of all the material included on the latest release of the CompTIA Network+ exam inside this fully updated, comprehensive resource. Written by CompTIA certification and training expert Mike Meyers, this authoritative exam guide features learning object...

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Bibliographic Details
Main Author: Meyers, Mike (Author)
Corporate Author: Safari, an O'Reilly Media Company
Format: eBook
Language:English
Published: McGraw-Hill, 2009.
Edition:4th edition.
Subjects:
Online Access:Connect to this electronic resource
Description
Summary:All-in-One is All You Need Get complete coverage of all the material included on the latest release of the CompTIA Network+ exam inside this fully updated, comprehensive resource. Written by CompTIA certification and training expert Mike Meyers, this authoritative exam guide features learning objectives at the beginning of each chapter, exam tips, practice questions, and in-depth explanations. Designed to help you pass the CompTIA Network+ exam with ease, this definitive volume also serves as an essential on-the-job reference. Covers all exam topics, including how to: Build a network with the OSI seven-layer model Configure network hardware, topologies, and cabling Connect multiple Ethernet components Configure wireless networks Work with network protocols, including TCP/IP, DNS, SIP, and IMAP Configure IPv4 and IPv6 routing protocols Share and access network resources Interconnect network operating systems-Windows, Mac OS, UNIX/Linux Set up clients and servers for remote access Monitor and troubleshoot networks Secure networks with firewalls, packet filtering, encryption, authentication, and other methods The CD-ROM features Hundreds of practice questions Video introduction to CompTIA Network+ A collection of Mike's favorite shareware and freeware networking tools and utilities Complete electronic book
Item Description:Electronic resource.
Physical Description:1 online resource (864 pages)
Format:Mode of access: World Wide Web.