The growing threat to Air Force mission-critical electronics : lethality at risk : unclassified summary /

Bibliographic Details
Other Authors: Fuller, Joan (Editor), Darbes, Steven (Editor)
Format: Book
Language:English
Published: Washington, D.C. : National Academies Press, [2019]
Series:Consensus study report.
Subjects:
Description
Physical Description:xii, 97 pages : illustrations ; 26 cm.
Bibliography:Includes bibliographical references.
ISBN:9780309493901
0309493900