VLSI and Post-CMOS Electronics. Volume 2 : Devices, circuits and interconnects /

The following topics are dealt with: integrated circuit design; VLSI; technology CAD (electronics); MOSFET; III-V semiconductors; silicon; semiconductor device models; SRAM chips; three-dimensional integrated circuits; permittivity.

Bibliographic Details
Corporate Author:	Institution of Engineering and Technology
Other Authors:	Chandel, Rajeevan (Editor), Dhiman, Rohit (Editor)
Format:	eBook
Language:	English
Published:	Stevenage : IET, 2019.
Series:	Materials, Circuits & Devices.
Subjects:	Dielectric measurements. Dielectrics. Electric resistance. Electronic apparatus and appliances. Integrated circuits > Computer-aided design. Integrated circuits > Design and construction. Integrated circuits > Very large scale integration. Integrated circuits. Metal oxide semiconductor field-effect transistors. Semiconductors. Silicon. CMOS integrated circuits. III-V semiconductors. MOSFET. SRAM chips. VLSI. elemental semiconductors. integrated circuit design. permittivity. semiconductor device models. silicon. technology CAD (electronics) three-dimensional integrated circuits. III-V semiconductors MOSFET SRAM chips VLSI integrated circuit design permittivity semiconductor device models silicon three-dimensional integrated circuits
Online Access:	Connect to the full text of this electronic book

Description
Summary:	The following topics are dealt with: integrated circuit design; VLSI; technology CAD (electronics); MOSFET; III-V semiconductors; silicon; semiconductor device models; SRAM chips; three-dimensional integrated circuits; permittivity.
Physical Description:	1 online resource (387 pages)
ISBN:	9781839530548
DOI:	10.1049/PBCS073G