rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Characterization of Wide Bandgap Power Semiconductor Devices
  name:
    name part: Wang, Fei (Fred)
    role:
      role term: creator
  name:
    name part: Jones, Edward A.
  name:
    name part: Zhang, Zheyu.
  name:
    name part: Institution of Engineering and Technology
  type of resource: text
  origin info:
    place:
      place term: enk
    date issued: 2018
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: electronic
    form: remote
    extent: 1 online resource (376 pages)
  abstract: The book has 11 chapters and covers the following topics: Pulsed static characterization; Junction capacitance characterization; Fundamentals of dynamic characterization; Gate drive for dynamic characterization; Layout design and parasitic management; Protection design for double pulse test; Measurement and data processing for dynamic characterization; Cross-talk consideration; Impact of three-phase system; Topology consideration; and Appendices on Recommended equipment and components list for DPT setup; and Data processing code for dynamic characterization are given.
  target audience: specialized
  note: Fei (Fred) Wang, Zheyu Zhang and Edward A. Jones.
  subject:
    topic: Electric capacity
  subject:
    topic: Electronic apparatus and appliances
  subject:
    topic: Power semiconductors
  subject:
    topic: Semiconductors
  subject:
    topic: Wide gap semiconductors
  subject:
    topic: capacitance
  subject:
    topic: network topology
  subject:
    topic: power semiconductor devices
  subject:
    topic: semiconductor device models
  subject:
    topic: wide band gap semiconductors
  subject:
    topic: cross-talk
  subject:
    topic: data processing
  subject:
    topic: double pulse test protection design
  subject:
    topic: dynamic characterization measurement
  subject:
    topic: gate drive
  subject:
    topic: junction capacitance characterization
  subject:
    topic: layout design
  subject:
    topic: parasitic management
  subject:
    topic: pulsed static characterization
  subject:
    topic: three-phase system
  subject:
    topic: topology
  subject:
    topic: wide bandgap power semiconductor devices
  classification: QC611.8.W53 W364 2018
  related item:
    title info:
      title: Energy Engineering
  identifier: 9781785614927
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: UkSgIET
    record creation date: 180903
    record change date: 20210304161732.0
    record identifier: in00004090132
    language of cataloging:
      language term: eng