http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
measurement metric for forensic latent fingerprint preprocessing
National Institute of Standards and Technology (U.S.)
Information Technology Laboratory, Material Measurement Laboratory.
1 online resource (42 pages) : illustrations (black and white).
Haiying Guan; Andrew Dienstfrey; Mary Theofanos; Brian Stanton.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page (viewed July 23, 2014).