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Toward ontology evaluation across the life cycle /

Bibliographic Details
Main Author: Neuhaus, Fabian
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Ray, Steve, Sriram, Ram D.
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2014.
Series:NISTIR ; 8008.
Online Access:https://purl.fdlp.gov/GPO/gpo104423

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