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NIST workshop on ontology evaluation /

Bibliographic Details
Main Author: Sriram, Ram D.
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Bock, C. (Conrad), Brady, Mary, Luciano, Joanne S., Musen, Mark A., Neuhaus, Fabian, Wallace, Evan
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.
Series:NISTIR ; 7774.
Online Access:https://purl.fdlp.gov/GPO/gpo99510

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