NIST workshop on ontology evaluation /

Bibliographic Details

Main Author:	Sriram, Ram D.
Corporate Author:	National Institute of Standards and Technology (U.S.)
Other Authors:	Bock, C. (Conrad), Brady, Mary, Luciano, Joanne S., Musen, Mark A., Neuhaus, Fabian, Wallace, Evan
Format:	Government Document eBook
Language:	English
Published:	Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2011.
Series:	NISTIR ; 7774.
Online Access:	https://purl.fdlp.gov/GPO/gpo99510