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Analysis of dimensional metrology standards /

Bibliographic Details
Main Author: Evans, John
Corporate Author: National Institute of Standards and Technology (U.S.)
Other Authors: Frechette, Simon, Horst, John, Huang, Hui, Kramer, Thomas, Messina, E. R. (Elena R.), Proctor, Frederick M., Rippey, Bill, Scott, Harry, Vorburger, Ted, Wavering, Al
Format: Government Document eBook
Language:English
Published: Gaithersburg, MD : U.S. Dept. of Commerce, National Institute of Standards and Technology, 2001.
Series:NISTIR ; 6847.
Online Access:https://purl.fdlp.gov/GPO/gpo99471
Description
Item Description:2001.
Contributed record: Metadata reviewed, not verified. Some fields updated by batch processes.
Title from PDF title page.
Physical Description:1 online resource.
Bibliography:Includes bibliographical references.