Impact of accelerated stress-tests on SIC MOSFET precursor parameters /

Bibliographic Details
Main Author:	Kozak, Joseph P. (Author)
Format:	Government Document eBook
Language:	English
Published:	[Golden, Colo.] : National Renewable Energy Laboratory, 2018.
Series:	Conference paper (National Renewable Energy Laboratory (U.S.)) ; NREL/CP-5000-71331.
Subjects:	Metal oxide semiconductor field-effect transistors > Testing. Silicon carbide.
Online Access:	https://purl.fdlp.gov/GPO/gpo109815

Description
Item Description:	"Preprint." "Presented at International Symposium on 3D Power Electronics Integration and Manufacturing (3D PEIM), College Park, Maryland, June 25 - 27, 2018." "August 2018."
Physical Description:	1 online resource (5 pages) : color illustrations.
Bibliography:	Includes bibliographical references (page 5).