Description
| Abstract: | Several techniques for charting autocorrelated process data have been proposed in the literature, and are in common use, but their properties have generally not been investigated. Since autocorrelated data is quite prevalent, especially in the process industries, it is important to find a procedure that has acceptable statistical properties. In this paper we investigate the properties of an X Chart of residuals for process data that would adhere to one of several common time series models. |
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| Item Description: | "March, 1992"--Leaf 1.
Funding information taken from leaf 22. |
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| Physical Description: | 24 leaves, 11 unnumbered leaves, 8, 12 leaves : illustrations ; 28 cm |
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| Bibliography: | Includes bibliographical references (leaves 8-9). |
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