Rietveld refinement : practical pattern analysis using TOPAS /

Bibliographic Details
Main Author:	Dinnebier, Robert E. (Author)
Format:	Book
Language:	English
Published:	Berlin ; Boston : Walter De Gruyter, [2019]
Subjects:	Rietveld method. X-rays > Diffraction. Crystallography.

Description
Physical Description:	xvi, 331 pages : color illustrations ; 24 cm.
Bibliography:	Includes bibliographical references and index.
ISBN:	9783110456219 3110456214