rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Measurement techniques for radio frequency nanoelectronics
  name:
    name part: Wallis, T. Mitch
    name part: 1974-
    role:
      role term: creator
    role:
      role term: author.
  name:
    name part: Kaboš, P. (Pavel)
    role:
      role term: author.
  name:
    name part: Cambridge University Press
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 2017
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource.
  note: T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder.
  note: Electronic resource.
  note: Includes bibliographical references and index.
  subject:
    topic: Nanoelectronics
  subject:
    topic: Radio frequency microelectromechanical systems
  subject:
    topic: Radio frequency
    topic: Measurement
  classification: TK6552.5 .W35 2017
  classification: 621.3841/30287
  related item:
    identifier: (DLC) 2017032744
  related item:
    title info:
      title: Cambridge RF and microwave engineering series
  identifier: 131634309X (electronic bk.)
  identifier: 9781316343098 (electronic bk.)
  identifier: 1107120683
  identifier: 9781107120686
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: NhCcYBP
    record creation date: 171024
    record change date: 20210728130421.0
    record identifier: in00003924123