http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Measurement techniques for radio frequency nanoelectronics
T. Mitch Wallis, National Institute of Standards and Technology, Boulder, Pavel Kabos, National Institute of Standards and Technology, Boulder.
Includes bibliographical references and index.
Radio frequency microelectromechanical systems
Cambridge RF and microwave engineering series