http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Electrical impact of SiC structural crystal defects on high electric field devices
Electrical impact of silicon carbide structural crystal defects on high electric field devices
1 online resource (6 pages) : illustrations.
"Prepared for the 1999 International Conference on Silicon Carbide and Related Materials sponsored by North Carolina State University, Raleigh, North Carolina, October 10-15, 1999."
"Performing organization: National Aeronautics and Space Administration, John H. Glenn Research Center at Lewis Field"--Report documentation page.
Includes bibliographical references (page 6).
Sponsored by the National Aeronautics and Space Administration WU-505-23-1N-00 E-11995