Advanced transmission electron microscopy : imaging and diffraction in nanoscience /

Bibliographic Details
Main Author: Zuo, Jian Min
Other Authors: Spence, John C. H.
Format: Book
Language:English
Published: New York : Springer Verlag, [2017]
Subjects:
Description
Physical Description:xxvi, 729 pages : illustrations (some color) ; 25 cm.
Bibliography:Includes bibliographical references and indexes.
ISBN:9781493966059
1493966057