rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    non sort: An
    title: introduction to mixed-signal IC test and measurement
  name:
    name part: Roberts, Gordon W.
    name part: 1959-
    role:
      role term: creator
  name:
    name part: Taenzler, Friedrich.
  name:
    name part: Burns, Mark
    name part: 1962-
  name:
    name part: Knovel (Firm)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: nyu
    date issued: 2012
    edition: 2nd ed.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xxv, 836 pages) : illustrations.
  abstract: "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher.
  table of contents: Overview of mixed-signal testing -- Tester hardware -- DC and parametric measurements -- Data analysis and probability theory -- Yield, measurement accuracy, and test time -- DAC testing -- ADC testing -- Sampling theory -- DSP-based testing -- Analog channel testing -- Sampled channel testing -- Fundamentals of RF testing -- RF test methods -- Clock and serial data communications channel measurements -- Tester interfacing--DIB design -- Design for test (DfT).
  note: Gordon Roberts, Friedrich Taenzler, Mark Burns.
  note: Burns' name appears first on the previous edition.
  note: Electronic resource.
  note: Includes bibliographical references and index.
  subject:
    topic: Integrated circuits
    topic: Testing
  subject:
    topic: Mixed signal circuits
    topic: Testing
  subject:
    topic: Integrated circuits
    topic: Testing
  subject:
    topic: Mixed signal circuits
    topic: Testing
  classification: TK7874 .B825 2012eb
  classification: 621.3815
  related item:
    title info:
      title: Introduction to mixed-signal IC test and measurement
    name:
      name part: Roberts, Gordon W., 1959-
    origin info:
      publisher: New York : Oxford University Press, ©2012
      edition: 2nd ed.
    identifier: (DLC) 2011031312
    identifier: (OCoLC)774691433
  related item:
    title info:
      title: Oxford series in electrical and computer engineering
  identifier: 9781613449486
  identifier: 1613449488
  identifier: 9780199796212
  identifier: 0199796211
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: KNOVL
    record creation date: 120801
    record change date: 20260609152734.4
    record identifier: in00003837092
    language of cataloging:
      language term: eng