An introduction to mixed-signal IC test and measurement /
"With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topic...
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| Corporate Author: | |
| Other Authors: | , |
| Format: | eBook |
| Language: | English |
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New York :
Oxford University Press,
[2012]
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| Edition: | 2nd ed. |
| Series: | Oxford series in electrical and computer engineering.
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| Subjects: | |
| Online Access: | Connect to the full text of this electronic book |
| Summary: | "With the proliferation of complex semiconductor devices containing digital, analog, mixed-signal and radio-frequency circuits, the economics of test has come to the forefront and today's engineer needs to be fluent in all four circuit types. Having access to a book that covers these topics will help the evolving test engineer immensely and will be an invaluable resource. In addition, the second edition includes lengthy discussion on RF circuits, high-speed I/Os and probabilistic reasoning. Appropriate for the junior/senior university level, this textbook includes hundreds of examples, exercises and problems"--Provided by publisher. |
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| Item Description: | Burns' name appears first on the previous edition. Electronic resource. |
| Physical Description: | 1 online resource (xxv, 836 pages) : illustrations. |
| Bibliography: | Includes bibliographical references and index. |
| ISBN: | 9781613449486 1613449488 |