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Ionizing radiation effects in electronics : from memories to imagers /

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Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: Bagatin, Marta (Editor), Gerardin, Simone (Editor)
Format: eBook
Language:English
Published: Boca Raton, FL : CRC Press, [2016]
Series:Devices, circuits, and systems.
Subjects:
Ionizing radiation.
TECHNOLOGY & ENGINEERING / Mechanical.
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Front Cover; Contents; Preface; Editors; Contributors; Chapter 1: Introduction to the Effects of Radiation on Electronic Devices; Chapter 2: Monte Carlo Simulation of Radiation Effects; Chapter 3: A Complete Guide to Multiple Upsets in SRAMs Processed in Decananometric CMOS Technologies; Chapter 4: Radiation Effects in DRAMs; Chapter 5: Radiation Effects in Flash Memories; Chapter 6: Microprocessor Radiation Effects; Chapter 7: Soft-Error Hardened Latch and Flip-Flop Design; Chapter 8: Assuring Robust Triple-Modular Redundancy Protected Circuits in SRAM-Based FPGAs
  • Chapter 9: Single-Event Mitigation Techniques for Analog and Mixed-Signal CircuitsChapter 10: CMOS Monolithic Sensors with Hybrid Pixel-Like, Time-Invariant Front-End Electronics : TID Effects and Bulk Damage Study; Chapter 11: Radiation Effects on CMOS Active Pixel Image Sensors; Chapter 12: Natural Radiation Effects in CCD Devices; Chapter 13: Radiation Effects on Optical Fibers and Fiber-Based Sensors; Back Cover