rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Microelectronics failure analysis
    sub title: desk reference
  title info:
    title: Microelectronics failure analysis desk reference
  name:
    name part: Ross, Richard J.
  name:
    name part: Knovel (Firm)
  name:
    name part: ASM International
  name:
    name part: Electronic Device Failure Analysis Society
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: ohu
    date issued: 2011
    edition: 6th ed.
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xi, 660 pages) : illustrations
  table of contents: Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
  note: edited by Richard J. Ross ; EDFAS, ASM International.
  note: "ASM International, 2011, number 09110Z"--Page 4 of cover.
  note: Some online versions lack accompanying media packaged with the printed version.
  note: Electronic resource.
  note: Includes bibliographical references and indexes.
  subject:
    topic: Microelectronics
    topic: Materials
    topic: Testing
    genre: Handbooks, manuals, etc
  subject:
    topic: Microelectronics
    topic: Defects
    topic: Testing
    genre: Handbooks, manuals, etc
  subject:
    topic: Electronic apparatus and appliances
    topic: Testing
    genre: Handbooks, manuals, etc
  subject:
    topic: Electronics
    topic: Materials
    topic: Testing
    genre: Handbooks, manuals, etc
  subject:
    topic: Electronics
    topic: Materials
    topic: Defects
    genre: Handbooks, manuals, etc
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Electronics
    topic: Digital
  subject:
    topic: TECHNOLOGY & ENGINEERING
    topic: Electronics
    topic: Microelectronics
  classification: TK7871 .M52 2011eb
  classification: 621.381
  related item:
    title info:
      title: Microelectronics failure analysis
    origin info:
      publisher: Materials Park, Ohio : ASM International, ©2011
      edition: 6th ed.
    identifier: (OCoLC)701026679
  identifier: 9781613447598
  identifier: 1613447590
  identifier: 9781615037261
  identifier: 1615037268
  identifier: 161503725X
  identifier: 9781615037254
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: N$T
    record creation date: 120109
    record change date: 20260609152746.6
    record identifier: in00003833645
    language of cataloging:
      language term: eng