http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
Microelectronics failure analysis desk reference
Electronic Device Failure Analysis Society
1 online resource (xi, 660 pages) : illustrations
Section 1. Introduction -- section 2. Failure analysis process overviews -- section 3. Failure analysis topics -- section 4. Fault verification and classification -- section 5. Localization techniques -- section 6. Deprocessing and sample preparation -- section 7. Inspection -- section 8. Materials analysis -- section 9. Focused ion beam applications -- section 10. Management and reference information.
edited by Richard J. Ross ; EDFAS, ASM International.
"ASM International, 2011, number 09110Z"--Page 4 of cover.
Some online versions lack accompanying media packaged with the printed version.
Includes bibliographical references and indexes.
Materials Park, Ohio : ASM International, ©2011