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In-situ electron microscopy at high resolution /

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Bibliographic Details
Corporate Author: Knovel (Firm)
Other Authors: Banhart, Florian
Format: eBook
Language:English
Published: Hackensack, NJ : World Scientific, [2008]
Subjects:
Electron microscopy > Technique.
High resolution electron microscopy.
Electronic books.
Online Access:Connect to the full text of this electronic book
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Published 2008
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