Knovel (Firm), INSPEC (Information service), & Hull, R. (1999). Properties of crystalline silicon. INSPEC, the Institution of Electrical Engineers.
Chicago Style (17th ed.) CitationKnovel (Firm), INSPEC (Information service), and Robert Hull. Properties of Crystalline Silicon. London: INSPEC, the Institution of Electrical Engineers, 1999.
MLA (9th ed.) CitationKnovel (Firm), et al. Properties of Crystalline Silicon. INSPEC, the Institution of Electrical Engineers, 1999.
Warning: These citations may not always be 100% accurate.