rdf-syntax-grammar
mods:
  schema location: http://www.loc.gov/mods/v3 http://www.loc.gov/standards/mods/v3/mods-3-2.xsd
  title info:
    title: Properties of porous silicon
  name:
    name part: Canham, Leigh T.
  name:
    name part: Knovel (Firm)
  name:
    name part: INSPEC (Information service)
  type of resource: text
  genre: bibliography
  genre: Electronic books.
  origin info:
    place:
      place term: enk
    date issued: 1987
    issuance: monographic
  language:
    language term: eng
  physical description:
    form: remote
    extent: 1 online resource (xviii, 405 pages) : illustrations.
  note: edited by Leigh Canham.
  note: Electronic resource.
  note: Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002. http://purl.oclc.org/DLF/benchrepro0212 MiAaHDL
  note: digitized 2010 HathiTrust Digital Library committed to preserve pda MiAaHDL
  note: Includes bibliographical references and index.
  subject:
    topic: Porous silicon
  subject:
    topic: Semiconductors
  subject:
    topic: Porous silicon
  subject:
    topic: Semiconductors
  subject:
    topic: Semiconducteurs
  subject:
    topic: Optoélectronique
  subject:
    topic: Silicium
  subject:
    topic: Matériaux poreux
  classification: TK7871.15.S55 P77 1987eb
  classification: 546/.683
  classification: JL 18
  related item:
    title info:
      title: Properties of porous silicon
    origin info:
      publisher: London : IEE : INSPEC, ©1987
    identifier: (OCoLC)38206806
  related item:
    title info:
      title: EMIS datareviews series ; no. 18
  identifier: 1591248582
  identifier: 9781591248583
  identifier: 0852969325
  identifier: 9780852969328
  identifier: Knovel Corporation
  identifier: http://proxy.library.tamu.edu/login
  record info:
    record content source: KNOVL
    record creation date: 051102
    record change date: 20260609152815.8
    record identifier: in00003828403
    language of cataloging:
      language term: eng