Value analysis tear-down : a new process for product development and innovation /

Bibliographic Details
Main Author: Sato, Yoshihiko
Corporate Author: Knovel (Firm)
Other Authors: Kaufman, J. Jerry
Format: eBook
Language:English
Published: New York : Industrial Press : Society of Manufacturing Engineers, 2005.
Edition:1st ed.
Subjects:
Online Access:Connect to the full text of this electronic book