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Value analysis tear-down : a new process for product development and innovation /

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Bibliographic Details
Main Author: Sato, Yoshihiko
Corporate Author: Knovel (Firm)
Other Authors: Kaufman, J. Jerry
Format: eBook
Language:English
Published: New York : Industrial Press : Society of Manufacturing Engineers, 2005.
Edition:1st ed.
Subjects:
Value analysis (Cost control)
Industrial productivity.
New products.
Engineering economy.
New Products.
Engineering Economy.
Analyse de la valeur.
Produits nouveaux.
Electronic books.
Online Access:Connect to the full text of this electronic book
Table of Contents:
  • Ch. 1. VA tear-down : what it is, how it developed
  • Ch. 2. Value analysis and VA tear-down
  • Ch. 3. The VA tear-down process
  • Ch. 4. Applying VA tear-down to issues of concern
  • Ch. 5. Evaluating VA tear-down results
  • Ch. 6. Other measures of competitiveness with VA tear-down.