Value analysis tear-down : a new process for product development and innovation /

Bibliographic Details
Main Author: Sato, Yoshihiko
Corporate Author: Knovel (Firm)
Other Authors: Kaufman, J. Jerry
Format: eBook
Language:English
Published: New York : Industrial Press : Society of Manufacturing Engineers, 2005.
Edition:1st ed.
Subjects:
Online Access:Connect to the full text of this electronic book
Description
Item Description:Electronic resource.
Physical Description:1 online resource (x, 206 pages) : illustrations
Format:Master and use copy. Digital master created according to Benchmark for Faithful Digital Reproductions of Monographs and Serials, Version 1. Digital Library Federation, December 2002.
Bibliography:Includes bibliographical references (page 199) and index.
ISBN:9781615835799
1615835792
9780831132033
0831132035